|
KMID : 1059519910350050539
|
|
Journal of the Korean Chemical Society
1991 Volume.35 No. 5 p.539 ~ p.544
|
|
|
The Thickness Determination of Silicone Resin on Zinc Electroplated Steels using Compton Scattering
|
|
So Jae-Chun
Lee Do-Hyung
|
|
|
Abstract
|
|
|
|
A method to determine the thickness of silicone resin film on zinc eletroplated steel using X-ray compton scattering was investigated. On the basis of the fact that compton scattering process predominates over photoelectric absorption for the light elements such as C, H, O and Si, the compton scattered line of RhKα was used to determine the thickness of silicone resin. In this method, the standard calibration curve for thickness determination of silicone resin film was found to be linear in the range of 0.2~5.0 μm film thickness. The analytical results agreed well with those obtained by the gravimetric method and the accuracy was found to be 0.22 μm.
|
|
|
KEYWORD
|
|
|
|
|
|
FullTexts / Linksout information
|
|
|
|
|
|
Listed journal information
|
|
|